Spectroscopic Ellipsometry for Photovoltaics: Volume 2: Applications and Optical Data of Solar Cell Materials by Hiroyuki Fujiwara
English | PDF,EPUB | 2019 | 616 Pages | ISBN : 3319951378 | 80.1 MB
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods.
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