Single-Event Effects, from Space to Accelerator Environments Analysis, Prediction and Hardening by Design

Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologiesAddresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologiesReveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levelsOffers readers the first book in which particle accelerator applications will be extensively included in the radiation effects contextThis is an open access book.

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